3+ day, 12+ hour ago   (181+ words) Enabling a comprehensive digital verification thread built on Verification Capture Points, structured coverage artifacts that link parameterized requirements to the verification results, models, context, and configurations. The post Rethinking Verification Traceability for Modern Systems appeared first on Semiconductor Engineering. As…...

3+ day, 12+ hour ago   (591+ words) Discrete steps are being merged with others as dimensions shrink into the angstrom range. The lines between discrete semiconductor manufacturing processes are starting to blur at sub-2nm nodes as transistors continue to shrink, sensitivity to various processes rises, and the…...

3+ day, 12+ hour ago   (202+ words) How early RTL testability analysis and DFT optimization enable shift left strategies that improve manufacturing test quality, reduce turnaround time, and deliver early quality estimates. The post Accelerating Shift Left With Early RTL DFT Analysis And Connectivity Verification appeared first…...

3+ day, 12+ hour ago   (473+ words) By Guy Cortez, Dan Alexandrescu, and Aaron Barker The semiconductor industry has invested heavily in embedded monitors to gain visibility into advanced silicon. Those monitors are essential, but the next step is not simply to collect a larger volume of…...

3+ day, 11+ hour ago   (278+ words) Semiconductor manufacturing generates enormous volumes of data, yet only a fraction of it is analyzed. To quote a recent article from an industry analyst: “Beneath this growth lies a structural shift. Manufacturing complexity is rising faster than the industry’s ability…...

3+ day, 11+ hour ago   (139+ words) semiengineering.com But in recent years, the conversation has started to change. Today, companies and countries alike are asking different questions. What happens when efficiency conflicts with resilience? What happens when supply chains become strategic? And what happens when interdependency…...

3+ day, 12+ hour ago   (222+ words) How data feed-forward infrastructure collects, transforms, transports, and applies test data across the full supply chain. The post AI-Driven Data Feed Forward: Scaling Advanced Test Methodologies For Chiplet-Based Packages appeared first on Semiconductor Engineering. The transition from monolithic dies to…...

4+ day, 12+ hour ago   (304+ words) Compute vs. energy scaling; adapting to AI; fab digital twin; mobile VLM. Synopsys’ Greg Sorber listens in as industry experts discuss the mismatch between the rapid growth of AI compute and the much slower scaling of the energy systems that power…...

1+ week, 2+ day ago   (328+ words) In-Depth Reports and Deals New Technologies Security Vehicles Research Quantum Workforce | Education Events and Webinars EPFL researchers demonstrated a GaN-on-Si transistor using a polarization superjunction that sustained more than 3.4 kV, along with diodes that exceeded 3.9 kV. Seoul National University-led researchers…...

1+ week, 3+ day ago   (320+ words) By Vincent van der Leest and Ajay Kapoor The same principle applies beyond aerospace and government systems: manipulated medical or financial data can affect critical decisions, while altered training data, model parameters, or inference inputs can poison an AI system....